From Nano to Micro Probes: Advanced Characterization Methods

Aug. 28-29, 2017
University of Minnesota-Twin Cities Campus

108 Mechanical Engineering Building
111 Church Street 
Minneapolis, MN 55455

This workshop offers two mornings of seminars and two afternoons of demonstrations at CharFac and the Imaging Centers' various facilities. There is a fee to attend the afternoon demos and space is limited so be sure to register soon.

Registration is now closed (8/25/17)

Workshop schedule

Monday Aug. 28-Morning Seminars

Introduction to IPRIME                                                       Bob Lewis
Introduction to the Characterization Facility                  Greg Haugstad
Compositional and Chemical Analysis in the TEM         Jason Myers
Dual-beam FIB/SEM and analysis with
EBSD/TKD and STEM EDS                                                  Nick Seaton
Auger electron spectroscopy and microscopy              Geoff Rojas
X-ray photoelectron spectroscopy                                   Bing Luo
X-ray scattering: beyond phase identification                Javier
and determination of lattice constants                           Garcia-Barriocanal
Nuclear scattering: nondestructive depth profiling
and impurity analysis with RBS, FReS and PIXE              Greg Haugstad

Monday Aug. 28-Afternoon Demonstrations

Analytical TEM
Presented by Jason Myers

Analytical SEM
Presented by Nick Seaton

X-ray scattering
Presented by Javier Garcia-Barriocanal

X-ray photoelectron spectroscopy
Presented by Bing Luo

Auger spectroscopy
Presented by Geoff Rojas

Ion beam analysis of multilayer systems
Presented by Greg Haugstad

Tuesday Aug. 29-Morning Seminars

Introductory remarks                                                             Greg Haugstad
CryoSEM                                                                                    Han Seung Lee
TEM image analysis and 3D reconstruction                        Wei Zhang
Visible-light spectral confocal fluorescence                         Mark Sanders &
imaging                                                                                       Guillermo Marques
Confocal Raman Microscopy                                                   Bing Luo
Valence band characterization by local and
integral methods: STM and UPS                                             Geoff Rojas
Imaging and probing multiphase materials with
advanced AFM                                                                           Greg Haugstad

Tuesday August 29-Afternoon Demonstrations

TEM 3D image reconstruction
Presented by Wei Zhang

CryoSEM of aqueous emulsions
Presented by Han Seung Lee & Chris Frethem

Confocal Raman microscopy
Presented by Bing Luo

Confocal fluorescence microscopy
Presented by Mark Sanders and Guillermo Marques

Advanced methods in AFM of soft matter
Presented by Greg Haugstad